K.L. Bhatia、D. P. Gosain、G. Parthasarathy 等 4 位作者1986-01-15Physical review. B, Condensed matter
The electrical resistivity of layerd crystalline GeSe has been investigated up to a pressure of 100 kbar and down to liquid-nitrogen temperature by use of a Bridgman anvil device. A pressure-induced first-order phase transition has been observed in single-crystal GeSe near 6 GPa. The high-pressure phase is found to be…
Semiconductor Quantum Structures and DevicesPhase-change materials and chalcogenidesSemiconductor materials and interfaces
Yoshichika Ōnuki、K. Ina、Toshiyuki Hirai 等 4 位作者1986-01-15Journal of the Physical Society of Japan
The Mn-intercalated transition metal dichalcogenides Mn 1/4 NbS 2 and Mn 1/4 TaS 2 have been found to be easy-plane type ferromagnets from the magnetization curves, while the magnetization curve of Mn 1/4 NbSe 2 shows a spin flopping behavior, suggesting a helical spin structure along the c -axis. The valency of Mn io…
2D Materials and ApplicationsNanocluster Synthesis and ApplicationsInorganic Chemistry and Materials
S. Logothetidis、P. Lautenschlager、M. Cardona1986-01-15Physical review. B, Condensed matter
The dielectric function of orthorhombic GeS has been measured ellipsometrically in the 1.66--5.6-eV photon-energy region as a function of temperature between 84 and 500 K. The second derivatives with respect to frequency of the real and imaginary parts of the dielectric function, obtained numerically from the measured…
Photonic and Optical DevicesChalcogenide Semiconductor Thin FilmsPhase-change materials and chalcogenides
Frank W. Kutzler、D. E. Ellis1986-01-15The Journal of Chemical Physics
The one-dimensional band structures of (tetrabenzoporphyrinato) Ni (II) and (phthalocyaninato) Ni (II) were calculated. The reported band structures include the effects of the stacking perturbation and of the overlap between nearest neighbors. The basis functions for the intermolecular integrals were obtained from a d…
Porphyrin and Phthalocyanine ChemistryPhotochemistry and Electron Transfer StudiesElectrochemical Analysis and Applications
F. Parmigiani、E. Kay、T. C. Huang 等 6 位作者1986-01-15Physical review. B, Condensed matter
The structure of thin silver films, grown under varying conditions of ion bombardment, are compared by means of their measured structural, optical, and electrical properties. Both the x-ray diffraction results and the dielectric-function measurements suggested that there are voids in our films and that their volume fr…
Semiconductor materials and devicesCopper Interconnects and ReliabilitySurface and Thin Film Phenomena
S. M. Myers、Peter Nordlander、Flemming Besenbacher 等 4 位作者1986-01-15Physical review. B, Condensed matter
Theoretical analysis of the defect trapping of ion-implanted hydrogen in metals has been extended in two respects. A new transport formalism has been developed which takes account not only of the diffusion, trapping, and surface release of the hydrogen, which were included in earlier treatments, but also the diffusion…
Hydrogen embrittlement and corrosion behaviors in metalsNuclear Materials and PropertiesIon-surface interactions and analysis
Gernot S. Pomrenke、H. Ennen、W.H. Haydl1986-01-15Journal of Applied Physics
The characteristic 1.54-μm emission from the rare-earth element erbium implanted in GaAs, InP, and GaP was investigated through 10-K photoluminescence essentially as a function of anneal temperature, time, and method. The strip-heater, forming-gas, and quartz-ampoule anneal methods were utilized in the range of 400 to…
Semiconductor materials and devicesSilicon Nanostructures and PhotoluminescenceElectron and X-Ray Spectroscopy Techniques
J. F. Morar、F. J. Himpsel、G. Hollinger 等 6 位作者1986-01-15Physical review. B, Condensed matter
Unoccupied electronic states at the diamond (111) surface are studied by measuring both bulk- and surface-sensitive C 1s partial-yield soft-x-ray absorption spectra. Several absorption features are observed in the bulk band gap below the 289.19-eV bulk-C 1s absorption edge. They are associated with transitions from th…
Semiconductor materials and devicesDiamond and Carbon-based Materials ResearchElectronic and Structural Properties of Oxides
K. Barla、R. Hérino、G. Bomchil1986-01-15Journal of Applied Physics
Stress was determined in oxidized porous silicon layers using x-ray diffraction to measure the substrate curvature. Stress is always compressive and its magnitude depends on oxide quality. The maximum value is reached when the oxide obtained from porous silicon is densified by a high-temperature process and is equival…
Silicon Nanostructures and PhotoluminescenceNanowire Synthesis and ApplicationsAnodic Oxide Films and Nanostructures
Geoffrey B. Smith、Gunnar A. Niklasson、J. S. E. M. Svensson 等 4 位作者1986-01-15Journal of Applied Physics
Very thin gold films were prepared on glass by ion plating (IP) and by conventional evaporation (CE). Below a certain thickness—∼9 nm for IP and ∼15 nm for CE—the films comprised a metal network; above this thickness we found uniform films. Optical properties were recorded by spectrophotometry. Conspicuous near-infrar…
Thin-Film Transistor TechnologiesTransition Metal Oxide NanomaterialsOptical Coatings and Gratings
J. F. Morar、F. J. Himpsel、G. Hollinger 等 6 位作者1986-01-15Physical review. B, Condensed matter
By comparing the C 1s photoemission intensities from a clean diamond (111) surface to those obtained from a fluorine-covered surface, we conclude that a single (111) layer of atoms participates in the diamond 2\ifmmode\times\else\texttimes\fi{}1 surface reconstruction. The data interpretation presented does not rely o…
Semiconductor materials and devicesDiamond and Carbon-based Materials ResearchElectronic and Structural Properties of Oxides
W. Klein、H. L. Frisch1986-01-15The Journal of Chemical Physics
We derive equations for the single particle distribution function and the k dependent structure factor for hard sphere fluids in the infinite dimension (d=∞) limit. Consistent with an earlier prediction that hard spheres will have mean field behavior in the d→∞ limit we find a Kirkwood instability which is interpreted…
Phase Equilibria and ThermodynamicsMaterial Dynamics and PropertiesTheoretical and Computational Physics
J.C. Balland、J. P. Zielinger、M. Tapiero 等 5 位作者1986-01-14Journal of Physics D Applied Physics
Investigation of deep levels in high-resistivity bulk materials by photo-induced current transient spectroscopy. II. Evaluation of various signal processing methods, J C Balland, J P Zielinger, M Tapiero, J G Gross, C Noguet
Semiconductor materials and devicesElectron and X-Ray Spectroscopy TechniquesIntegrated Circuits and Semiconductor Failure Analysis
Alexander Aumüller、Siegfried Hünig1986-01-14Liebigs Annalen der Chemie
Abstract A new class of quinone derivatives, the dicyanodiimines 2 , 21 , and 23 , has been synthesized by the reaction of the corresponding quinones with bis(trimethylsilyl)carbondiimide ( 8 ) and titanium tetrachloride. A wide variety of substrates, even those which contain bulky groups and those which exhibit a str…
Organic and Molecular Conductors ResearchN-Heterocyclic Carbenes in Organic and Inorganic ChemistrySynthesis and Biological Evaluation
J. Wagner、C. Wild、F. G. Pohl 等 4 位作者1986-01-13Applied Physics Letters
Optical emission spectroscopy was applied to study the rf glow discharge in hydrocarbons used for the deposition of amorphous hydrogenated carbon (a-C:H). The optical data in conjunction with mass spectrometric measurements show that the species found in the glow region are very specific for the hydrocarbon used (e.g.…
Metal and Thin Film MechanicsDiamond and Carbon-based Materials ResearchLaser-induced spectroscopy and plasma
H. R. Philipp、H. S. Cole、Y. S. Liu 等 4 位作者1986-01-13Applied Physics Letters
Absorption coefficients for some technologically important polymer materials are given in the wavelength range ∼240–170 nm. Absorption coefficients at 193 nm for these polymers show a wide range of values from ∼2×102 cm−1 for polytetrafluoroethylene (Teflon) to ∼4×105 cm−1 for polyimide. The general nature of the opti…
Advancements in Photolithography TechniquesElectron and X-Ray Spectroscopy TechniquesSurface Roughness and Optical Measurements
Uzi Landman、W. D. Luedtke、R. N. Barnett 等 10 位作者1986-01-13Physical Review Letters
Molecular-dynamics simulations and in situ experimental observations of the melting and equilibrium structure of the crystalline Si(100)-melt interface are described. The equilibrium interface is structured, exhibiting facets established on (111) planes.
Aluminum Alloy Microstructure PropertiesSolidification and crystal growth phenomenananoparticles nucleation surface interactions
A. Kania、Krystian Roleder、G. E. Kugel 等 4 位作者1986-01-10Journal of Physics C Solid State Physics
Light-scattering investigations in the temperature range from 10 to 850K have been performed on single crystals of silver niobate AgNbO 3 . The results are compared with structural and dielectric measurements revealing a complex sequence of phases. The Raman results and especially the strong central peak, which occurs…
Ferroelectric and Piezoelectric MaterialsGlass properties and applicationsPhotorefractive and Nonlinear Optics
H. S. Cole、Y. S. Liu、H. R. Philipp1986-01-06Applied Physics Letters
Mixtures of poly(methyl methacrylate) and poly(α-methyl styrene) were prepared and their optical absorption coefficients at 193 nm were measured. A study of photoetching rate of these polymeric materials using an ArF excimer laser at 193 nm shows two regions of distinctly different etching characteristics. At relative…
Advancements in Photolithography TechniquesElectron and X-Ray Spectroscopy TechniquesSurface Roughness and Optical Measurements
Antonino Licciardello、Orazio Puglisi、S. Pignataro1986-01-06Applied Physics Letters
The oxidation kinetics of HF-etched n- and p-doped silicon in air at room temperature have been studied by electron spectroscopy for chemical analysis. No great differences have been found between the n- and p-type oxidation kinetics at the low doping level of the studied samples. The rate of oxide growth on the HF-et…
Semiconductor materials and devicesSilicon Nanostructures and PhotoluminescenceElectron and X-Ray Spectroscopy Techniques