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Stereological Techniques for Quantitative Characterization of Microstructures

A.M. Gokhale2016-07-01Microscopy and Microanalysis

Arun M Gokhale; Stereological Techniques for Quantitative Characterization of Microstructures, Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, P

Advanced Electron Microscopy Techniques and ApplicationsAdvanced X-ray Imaging TechniquesElectron and X-Ray Spectroscopy Techniques

Study of Direct Lithiation of Thin Si Membranes with Spatially-Correlative Low Energy Focused Li Ion Beam and Analytical Electron Microscopy Techniques

Vladimir P. Oleshko、Kevin A. Twedt、Christopher L. Soles 等 4 位作者2016-07-01Microscopy and Microanalysis

VP Oleshko, KA Twedt, CL Soles, JJ McClelland; Study of Direct Lithiation of Thin Si Membranes with Spatially-Correlative Low Energy Focused Li Ion Beam an

Advanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesIntegrated Circuits and Semiconductor Failure Analysis

Image Simulation and Analysis to Predict the Sensitivity Performance of a Multi-Electron Beam Wafer Defect Inspection Tool

Maseeh Mukhtar、Kathy Quoi、Benjamin Bunday 等 5 位作者2016-07-01Microscopy and Microanalysis

Maseeh Mukhtar, Kathy Quoi, Benjamin D Bunday, Matt Malloy, Brad Thiel; Image Simulation and Analysis to Predict the Sensitivity Performance of a Multi-Ele

Advancements in Photolithography TechniquesElectron and X-Ray Spectroscopy TechniquesIndustrial Vision Systems and Defect Detection

Recent Applications of Sub-20 meV Monochromated STEM-EELS: from Phonon to Core Losses in Real and Momentum Spaces

Quentin M. Ramasse、Fredrik S. Hage、Demie Kepaptsoglou 等 14 位作者2016-07-01Microscopy and Microanalysis

QM Ramasse, FS Hage, DM Kepaptsoglou, P Abellan, J Yates, RJ Nicholls, HC Nerl, V Nicolosi, K Winther, K Thygesen, PZ El Khoury, WP Hess, F Azough, R Freer

Advanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesIon-surface interactions and analysis

Real-World Electron Detector Performance in Scanning Electron Microscopes

Owen Healy、Richard B. Mott2016-07-01Microscopy and Microanalysis

Owen E Healy, Richard B Mott; Real-World Electron Detector Performance in Scanning Electron Microscopes, Microscopy and Microanalysis, Volume 22, Issue S3,

Electron and X-Ray Spectroscopy TechniquesPhotocathodes and Microchannel Plates

The Role of Secondary Electron Emission in the Charging of Thin-Film Phase Plates

Manuel Dries、R. Janzen、Tina Schulze 等 9 位作者2016-07-01Microscopy and Microanalysis

M Dries, R Janzen, T Schulze, J Schundelmeier, S Hettler, U Golla-Schindler, B Jaud, U Kaiser, D Gerthsen; The Role of Secondary Electron Emission in the C

ZnO doping and propertiesSemiconductor materials and devicesElectron and X-Ray Spectroscopy Techniques

High Performance in Low Voltage HR-STEM Applications Enabled By Fast Automatic Tuning of the Combination of a Monochromator and Probe Cs-Corrector

Sorin Lazar、Peter Tiemeijer、S. Henstra 等 6 位作者2016-07-01Microscopy and Microanalysis

Sorin Lazar, Peter Tiemeijer, Sander Henstra, Terry Dennemans, Jan Ringnalda, Bert Freitag; High Performance in Low Voltage HR-STEM Applications Enabled By

Advanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesIntegrated Circuits and Semiconductor Failure Analysis

Nano-Particle TEM Sample Preparation Primer

Olivia Vierrether、Jessica R. TerBush、Clarissa A. Wisner2016-07-01Microscopy and Microanalysis

Olivia Vierrether, Jessica TerBush, Clarissa Wisner; Nano-Particle TEM Sample Preparation Primer, Microscopy and Microanalysis, Volume 22, Issue S3, 1 July

Advanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesIntegrated Circuits and Semiconductor Failure Analysis

Characterization of Defects in III-V Semiconductor Materials (InP, GaAs and InGaAs/ InP on Si) in Nano-sized Patterns by Transmission Electron Microscopy

J.H. Lee、Y.D. Cho、I.G. Lee 等 7 位作者2016-07-01Microscopy and Microanalysis

JH Lee, YD Cho, IG Lee, CS Shin, WK Park, DH Kim, DH Ko; Characterization of Defects in III-V Semiconductor Materials (InP, GaAs and InGaAs/ InP on Si) in

Electron and X-Ray Spectroscopy TechniquesIon-surface interactions and analysisIntegrated Circuits and Semiconductor Failure Analysis

Sample Tilt Effects on Atom Column Position Determination in ABF-STEM Imaging

Dan Zhou、Knut Müller‐Caspary、Wilfried Sigle 等 6 位作者2016-07-01Microscopy and Microanalysis

Dan Zhou, Knut Müller-Caspary, Wilfried Sigle, Florian F Krause, Andreas Rosenauer, Peter A van Aken; Sample Tilt Effects on Atom Column Position Determina

Advanced Electron Microscopy Techniques and ApplicationsForce Microscopy Techniques and ApplicationsElectronic and Structural Properties of Oxides

Microporous Electrospun Scaffolds for Skin Repair and Regeneration

Paul P. Bonvallet、Susan L. Bellis2016-07-01Microscopy and Microanalysis

Paul P Bonvallet, Susan L Bellis; Microporous Electrospun Scaffolds for Skin Repair and Regeneration, Microscopy and Microanalysis, Volume 22, Issue S3, 1

Electrospun Nanofibers in Biomedical ApplicationsSilk-based biomaterials and applications

Improved Data Analysis and Reconstruction Methods for STEM-EDX Tomography

Zineb Saghi、Joshua F. Einsle、Roberts Blukis 等 8 位作者2016-07-01Microscopy and Microanalysis

Zineb Saghi, Joshua Einsle, Roberts Blukis, Ansis Strodahs, Rowan Leary, Pierre Burdet, Richard Harrison, Paul Midgley; Improved Data Analysis and Reconstr

Advanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesAdvanced Materials Characterization Techniques

Electrospun CeO 2 -ZnO Nanofibers Analyzed by Electron Probe Microanalyzer

Christina H. Young、John G. Moch、Shardai S. Johnson 等 4 位作者2016-07-01Microscopy and Microanalysis

Christina H Young, John G Moch, Shardai S Johnson, Zhiping Luo; Electrospun CeO 2 -ZnO Nanofibers Analyzed by Electron Probe Microanalyzer, Microscopy and

ZnO doping and propertiesCatalytic Processes in Materials ScienceGas Sensing Nanomaterials and Sensors

Low Voltage X-ray Mapping: The Complementary Methods of the Oxford Instruments X-Max Extreme Windowless EDS Detector and the JEOL Soft X-Ray Emission Spectroscopy (SXES)

G. McMahon、Simon Burgess、Masaru Takakura 等 5 位作者2016-07-01Microscopy and Microanalysis

G McMahon, S Burgess, M Takakura, H Takahashi, MG Burke; Low Voltage X-ray Mapping: The Complementary Methods of the Oxford Instruments X-Max Extreme Windo

X-ray Spectroscopy and Fluorescence AnalysisNuclear Physics and ApplicationsElectron and X-Ray Spectroscopy Techniques

Mapping EELS Vibrational Modes in MgO Nanocubes

Maureen J. Lagos、Philip E. Batson2016-07-01Microscopy and Microanalysis

M J Lagos, P E Batson; Mapping EELS Vibrational Modes in MgO Nanocubes, Microscopy and Microanalysis, Volume 22, Issue S3, 1 July 2016, Pages 954–955, http

Semiconductor materials and devicesAdvanced Electron Microscopy Techniques and ApplicationsElectronic and Structural Properties of Oxides

Biomineralization of Hydroxyapatite Revealed by in situ Electron Microscopy

Xiaoyue Wang、Jie Yang、Carmen M. Andrei 等 5 位作者2016-07-01Microscopy and Microanalysis

Xiaoyue Wang, Jie Yang, Carmen Andrei, Leyla Soleymani, Kathryn Grandfield; Biomineralization of Hydroxyapatite Revealed byin situElectron Microscopy, Micr

Bone Tissue Engineering MaterialsCalcium Carbonate Crystallization and InhibitionTitanium Alloys Microstructure and Properties

Multimodal Acquisition of Properties and Structure with Transmission Electron Reciprocal-space (MAPSTER) Microscopy

Jim Ciston、Colin Ophus、Peter Ercius 等 11 位作者2016-07-01Microscopy and Microanalysis

Jim Ciston, Colin Ophus, Peter Ercius, Hao Yang, Roberto dos Reis, Christopher T Nelson, Shang-Lin Hsu, Christoph Gammer, Burak V Ӧzdöl, Yu Deng, Andrew Mi

Semiconductor materials and devicesElectronic and Structural Properties of OxidesSurface and Thin Film Phenomena

Mapping Magnetic Ordering With Aberrated Electron Probes in STEM

Juan Carlos Idrobo、Ján Rusz、Jakob Spiegelberg 等 8 位作者2016-07-01Microscopy and Microanalysis

Juan Carlos Idrobo, Ján Rusz, Jakob Spiegelberg, Michael A McGuire, Christopher T Symons, Ranga Raju Vatsavai, Claudia Cantoni, Andrew R Lupini; Mapping Ma

Advanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesIntegrated Circuits and Semiconductor Failure Analysis

A Ge/SiNx Standard for Evaluating the Performance of X-ray Detectors in the SEM, S/TEM and AEM

Nestor J. Zaluzec、Jon‐Paul S. DesOrmeaux、James Roussie2016-07-01Microscopy and Microanalysis

Nestor J Zaluzec, Jon-Paul DesOrmeaux, James Roussie; A Ge/SiNx Standard for Evaluating the Performance of X-ray Detectors in the SEM, S/TEM and AEM, Micro

Semiconductor materials and devicesElectron and X-Ray Spectroscopy TechniquesSurface and Thin Film Phenomena

Oil flow surge test for 110kV power transformer during external short circuit faults

Chenguang Yan、Zhiguo Hao、Yiqi Dang 等 6 位作者2016-07-01OpenAlex

Large oil-immersed power transformers always have the gas relay equipped between the main tank and conservator. However, due to the inherent defects, the gas relay malfunction caused by external faults happens occasionally all over the world, which jeopardizes the safe operation of bulk power systems. In order to expl…

High voltage insulation and dielectric phenomenaPower Transformer Diagnostics and InsulationNon-Destructive Testing Techniques