Søren B. Vendelbo、Christian Fink Elkjær、I. Puspitasari 等 12 位作者2014-08-01Microscopy and Microanalysis
S B Vendelbo, C F Elkjær, I Puspitasari, J F Creemer, P Dona, L Mele, B Morana, BJ Nelissen, S Roobol, R van Rijn, S Helveg, P J Kooyman; Atomic-Scale Imag
Catalytic Processes in Materials ScienceAdvanced Materials Characterization TechniquesMachine Learning in Materials Science
Yoshiomi Hiranaga、Yasuo Cho2014-08-01OpenAlex
Ferroelectric single crystals have excellent characteristics for ferroelectric probe data storage. However, it is difficult to make practically-available single-crystal media with a large area, and development of thin-film recording media is required. In this study Pb(Zr, Ti)O3(PZT) thin films are prepared and evaluat…
Ferroelectric and Piezoelectric MaterialsMultiferroics and related materialsMicrowave Dielectric Ceramics Synthesis
Wen Qian、Simon Flower、Lauren Keel 等 4 位作者2014-08-01Microscopy and Microanalysis
Wen Qian, Simon Flower, Lauren Keel, Jun Jiao; Asymmetric Decoration of Crystalline Graphene with Pt&TiO2 Nanocrystals as High-Efficient Photocatalyst,
Advanced Nanomaterials in CatalysisAdvanced Photocatalysis TechniquesNanomaterials for catalytic reactions
Alexander Schwedt、Lars Hensgen、J. Dieckmann 等 6 位作者2014-08-01Microscopy and Microanalysis
A Schwedt, L Hensgen, J Dieckmann, A Klink, F Klocke, J Mayer; EBSD-Analysis of Microstructural Changes Below Wire-EDMed Surfaces, Microscopy and Microanal
Corrosion Behavior and InhibitionMetal and Thin Film MechanicsAluminum Alloy Microstructure Properties
P. K. Carpenter、John Donovan2014-08-01Microscopy and Microanalysis
P K Carpenter, J J Donovan; Quantitative Electron-probe Microanalysis and WDS Background Measurement, Microscopy and Microanalysis, Volume 20, Issue S3, 1
Advanced Materials Characterization TechniquesElectron and X-Ray Spectroscopy TechniquesX-ray Spectroscopy and Fluorescence Analysis
Marc De Graef2014-08-01Microscopy and Microanalysis
For more than seven decades, diffraction contrast in the TEM has been used for the study of both linear and planar lattice defects, such as dislocations, stacking faults, anti-phase boundaries, and so on. In recent years, several alternative approaches for defect imaging have become available: using a standard annular…
Electron and X-Ray Spectroscopy TechniquesIntegrated Circuits and Semiconductor Failure AnalysisAdvancements in Photolithography Techniques
Yun Jing Liu、Xiong Wei Zhang2014-08-01Applied Mechanics and Materials
With the development of modern industry, more and more semiconductor-based devices have been used widely. Such equipment presents nonlinear impedance to the utility, generating large harmonic currents with well known adverse effects, such as low power factor, low efficiency and destruction of other equipment. Also, so…
Power Quality and HarmonicsElectromagnetic Compatibility and Noise SuppressionMagnetic Properties and Applications
Daisuke Shindo、Zentaro Akase、Hyun Soon Park2014-08-01Microscopy and Microanalysis
Daisuke Shindo, Zentaro Akase, Hyun Soon Park; Collective Motion of Secondary Electrons Visualized by Electron Holography, Microscopy and Microanalysis, Vo
Electron and X-Ray Spectroscopy TechniquesAdvanced Electron Microscopy Techniques and ApplicationsPhotocathodes and Microchannel Plates
Everett D. Grimley、Xiahan Sang、James M. LeBeau2014-08-01Microscopy and Microanalysis
The radon transformation has demonstrated tremendous utility for the processing of tomographic reconstructions, though it remains largely unapplied to problems of imaging in scanning transmission electron microscopy (STEM). A complete radon transformation projects image intensities onto lines oriented at different ang…
Advanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy Techniques
M. G. Gandman、M. C. Ridgway、R. Gronsky 等 4 位作者2014-08-01Microscopy and Microanalysis
Maria Gandman, Mark Ridgway, Ronald Gronsky, Andreas M Glaeser; Microstructural Investigations of Platinum Shape Equilibration in Alumina, Microscopy and M
Aluminum Alloy Microstructure PropertiesAluminum Alloys Composites PropertiesMicrostructure and mechanical properties
Michael T. Postek、András Vládar、Bin Ming2014-08-01Microscopy and Microanalysis
Michael T Postek, Andras E Vladar, Bin Ming; Oliver C. Wells' Vision: Use of Low-Loss Electrons to Enhance and Measure the Surface Detail in the Scanning E
Electron and X-Ray Spectroscopy Techniques
Youngji Cho、Jun‐Mo Yang、Do Van Lam 等 7 位作者2014-08-01Microscopy and Microanalysis
Youngji Cho, Jun-Mo Yang, Do Van Lam, Seung-Mo Lee, Jae-Hyun Kim, Yun Chang Park, Jiho Chang; Morphology and Structure Anlysis of Graphene by Low Voltage T
Graphene research and applicationsElectron and X-Ray Spectroscopy Techniques
조태제2014-08-01한양법학
It is necessary for the safe decommissioning and environmental remediation in decommissioning of reactor facilities damaged by severe accidents to define policy setting and improvement legal system. Because there are only two regulations about decommissioning program and decommissioning funding and anyway these conten…
Graphite, nuclear technology, radiation studiesRisk and Safety AnalysisNuclear and radioactivity studies
Alexandre Cuenat、A Muniz-Piniella2014-08-01OpenAlex
This a outline of a review of metrological issues related to nanoscale electrical transport measurement presented at CPEM-2014. A brief overview of the instrumentation used to measure electrical transport properties at the nanoscale is presented and a few metrological issues are discussed.
Surface and Thin Film PhenomenaElectronic and Structural Properties of OxidesForce Microscopy Techniques and Applications
박나라、안동규、오진우2014-08-01OpenAlex
하드페이싱층과 기저부의 결합부에서 발생하는 잔류 응력/변형률을 감소시키기 위하여 열응력제어층에 대한 연구가 시작되고 있다. 이 연구에서는 3 차원 유한요소해석을 이용하여 Stellite21 초합금으로 하드페이싱된 STD61 열간금형강의 중간층으로 형성된 열응력제어층의 재료조합과 두께를 예측하고자 한다. 열응력제어층은 Stellite21 과 STD61 의 조합으로 생성하였다. 열응력제어층의 두께범위는 0.5-1.5 mm 로 선정하였다. 유한요소해석 결과를 이용하여 열응력제어층을 구성하는 Stellite21 과 STD61 의 혼합율 및 열응력제어층 두께에 따른 시편 내…
Marine and Coastal ResearchGraphite, nuclear technology, radiation studiesEngineering Applied Research
Fengyuan Yang、Yan Chen、Zhen Cai 等 10 位作者2014-08-01Microscopy and Microanalysis
F Yang, Y Chen, Z Cai, N Tsvetkov, M Burriel, H Tellez, B Yildiz, J A Kilner, DB Williams, DW McComb; High Resolution Electron Microscopy Characterization
Advancements in Battery MaterialsElectronic and Structural Properties of OxidesSemiconductor materials and devices
Jinwoo Hwang、Jack Zhang、Susanne Stemmer2014-08-01Microscopy and Microanalysis
Jinwoo Hwang, Jack Y Zhang, Susanne Stemmer; Progress in Applications of Quantitative STEM, Microscopy and Microanalysis, Volume 20, Issue S3, 1 August 201
Advanced Electron Microscopy Techniques and ApplicationsAdvanced Materials Characterization TechniquesElectron and X-Ray Spectroscopy Techniques
Phuong-Ha Cu-Nguyen、Adrian Grewe、Stefan Sinzinger 等 5 位作者2014-08-01OpenAlex
We present a highly compact, fully integrated tunable lens for confocal hyperspectral imaging with imprinted diffractive structures on a polydimethylsiloxane (PDMS) membrane. The PDMS membrane was patterned by replication technique with a diffractive optical element (DOE) on quartz glass as master mold. The smallest f…
Optical Coatings and GratingsPhotonic and Optical DevicesElectrowetting and Microfluidic Technologies
Alessandro Tuniz、Alexander Argyros、Simon Fleming 等 4 位作者2014-08-01OpenAlex
We present recent progress in fiber-based metamaterials. We have drawn fibers containing either sub-wavelength magnetic resonators or wire media, operating up to mid-infrared frequencies. This has led to the first fiber-based metamaterial hyperlenses capable of imaging and focusing well below the diffraction limit ove…
Metamaterials and Metasurfaces ApplicationsTerahertz technology and applicationsMillimeter-Wave Propagation and Modeling
Scott Hill、Leonard Lombardo、Jr Fling 等 4 位作者2014-08-01OpenAlex
Abstract : This scoring record documents the efforts of the Environmental Security Technology Certification Program to detect and discriminate inert unexploded ordnance (UXO) utilizing the APG Standardized UXO Technology Demonstration Site calibration lanes and open field sites. This Scoring Record was coordinated by…
Engineering and Material Science Research