Materials Literature

文献浏览

按标题、摘要、年份、主题和来源检索公开元数据。结果保留作者、摘要、分类与原始来源链接。

清除
第 215908 / 259281 页 · 当前展示 4,318,141–4,318,160 / 5,185,606 条匹配结果 · 摘要仅作预览

Measurement of nonlinear dielectric constants of Pb(Zr, Ti)O3 thin films for ferroelectric probe data storage technology

Yoshiomi Hiranaga、Yasuo Cho2014-08-01OpenAlex

Ferroelectric single crystals have excellent characteristics for ferroelectric probe data storage. However, it is difficult to make practically-available single-crystal media with a large area, and development of thin-film recording media is required. In this study Pb(Zr, Ti)O3(PZT) thin films are prepared and evaluat…

Ferroelectric and Piezoelectric MaterialsMultiferroics and related materialsMicrowave Dielectric Ceramics Synthesis

EBSD-Analysis of Microstructural Changes Below Wire-EDMed Surfaces

Alexander Schwedt、Lars Hensgen、J. Dieckmann 等 6 位作者2014-08-01Microscopy and Microanalysis

A Schwedt, L Hensgen, J Dieckmann, A Klink, F Klocke, J Mayer; EBSD-Analysis of Microstructural Changes Below Wire-EDMed Surfaces, Microscopy and Microanal

Corrosion Behavior and InhibitionMetal and Thin Film MechanicsAluminum Alloy Microstructure Properties

Quantitative Electron-probe Microanalysis and WDS Background Measurement

P. K. Carpenter、John Donovan2014-08-01Microscopy and Microanalysis

P K Carpenter, J J Donovan; Quantitative Electron-probe Microanalysis and WDS Background Measurement, Microscopy and Microanalysis, Volume 20, Issue S3, 1

Advanced Materials Characterization TechniquesElectron and X-Ray Spectroscopy TechniquesX-ray Spectroscopy and Fluorescence Analysis

Towards a Uniform Model for Lattice Defect Image Simulations

Marc De Graef2014-08-01Microscopy and Microanalysis

For more than seven decades, diffraction contrast in the TEM has been used for the study of both linear and planar lattice defects, such as dislocations, stacking faults, anti-phase boundaries, and so on. In recent years, several alternative approaches for defect imaging have become available: using a standard annular…

Electron and X-Ray Spectroscopy TechniquesIntegrated Circuits and Semiconductor Failure AnalysisAdvancements in Photolithography Techniques

The Study of Harmonic Suppression and Reactive Power Compensation

Yun Jing Liu、Xiong Wei Zhang2014-08-01Applied Mechanics and Materials

With the development of modern industry, more and more semiconductor-based devices have been used widely. Such equipment presents nonlinear impedance to the utility, generating large harmonic currents with well known adverse effects, such as low power factor, low efficiency and destruction of other equipment. Also, so…

Power Quality and HarmonicsElectromagnetic Compatibility and Noise SuppressionMagnetic Properties and Applications

Collective Motion of Secondary Electrons Visualized by Electron Holography

Daisuke Shindo、Zentaro Akase、Hyun Soon Park2014-08-01Microscopy and Microanalysis

Daisuke Shindo, Zentaro Akase, Hyun Soon Park; Collective Motion of Secondary Electrons Visualized by Electron Holography, Microscopy and Microanalysis, Vo

Electron and X-Ray Spectroscopy TechniquesAdvanced Electron Microscopy Techniques and ApplicationsPhotocathodes and Microchannel Plates

Application of the Projective Standard Deviation to STEM Imaging and Analysis

Everett D. Grimley、Xiahan Sang、James M. LeBeau2014-08-01Microscopy and Microanalysis

The radon transformation has demonstrated tremendous utility for the processing of tomographic reconstructions, though it remains largely unapplied to problems of imaging in scanning transmission electron microscopy (STEM). A complete radon transformation projects image intensities onto lines oriented at different ang…

Advanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy Techniques

Microstructural Investigations of Platinum Shape Equilibration in Alumina

M. G. Gandman、M. C. Ridgway、R. Gronsky 等 4 位作者2014-08-01Microscopy and Microanalysis

Maria Gandman, Mark Ridgway, Ronald Gronsky, Andreas M Glaeser; Microstructural Investigations of Platinum Shape Equilibration in Alumina, Microscopy and M

Aluminum Alloy Microstructure PropertiesAluminum Alloys Composites PropertiesMicrostructure and mechanical properties

Morphology and Structure Anlysis of Graphene by Low Voltage TEM

Youngji Cho、Jun‐Mo Yang、Do Van Lam 等 7 位作者2014-08-01Microscopy and Microanalysis

Youngji Cho, Jun-Mo Yang, Do Van Lam, Seung-Mo Lee, Jae-Hyun Kim, Yun Chang Park, Jiho Chang; Morphology and Structure Anlysis of Graphene by Low Voltage T

Graphene research and applicationsElectron and X-Ray Spectroscopy Techniques

중대사고로 손상된 원자력시설의 해체

조태제2014-08-01한양법학

It is necessary for the safe decommissioning and environmental remediation in decommissioning of reactor facilities damaged by severe accidents to define policy setting and improvement legal system. Because there are only two regulations about decommissioning program and decommissioning funding and anyway these conten…

Graphite, nuclear technology, radiation studiesRisk and Safety AnalysisNuclear and radioactivity studies

Electrical transport at the nanoscale: Scanning Spreading Resistance, Scanning Capacitance and Scanning Kelvin Probe

Alexandre Cuenat、A Muniz-Piniella2014-08-01OpenAlex

This a outline of a review of metrological issues related to nanoscale electrical transport measurement presented at CPEM-2014. A brief overview of the instrumentation used to measure electrical transport properties at the nanoscale is presented and a few metrological issues are discussed.

Surface and Thin Film PhenomenaElectronic and Structural Properties of OxidesForce Microscopy Techniques and Applications

3 차원 유한요소해석을 이용한 Stellite21 초합금으로 하드페이싱된 STD 61 열간금형강의 열응력제어층 재료조합 및 두께 예측

박나라、안동규、오진우2014-08-01OpenAlex

하드페이싱층과 기저부의 결합부에서 발생하는 잔류 응력/변형률을 감소시키기 위하여 열응력제어층에 대한 연구가 시작되고 있다. 이 연구에서는 3 차원 유한요소해석을 이용하여 Stellite21 초합금으로 하드페이싱된 STD61 열간금형강의 중간층으로 형성된 열응력제어층의 재료조합과 두께를 예측하고자 한다. 열응력제어층은 Stellite21 과 STD61 의 조합으로 생성하였다. 열응력제어층의 두께범위는 0.5-1.5 mm 로 선정하였다. 유한요소해석 결과를 이용하여 열응력제어층을 구성하는 Stellite21 과 STD61 의 혼합율 및 열응력제어층 두께에 따른 시편 내…

Marine and Coastal ResearchGraphite, nuclear technology, radiation studiesEngineering Applied Research

Progress in Applications of Quantitative STEM

Jinwoo Hwang、Jack Zhang、Susanne Stemmer2014-08-01Microscopy and Microanalysis

Jinwoo Hwang, Jack Y Zhang, Susanne Stemmer; Progress in Applications of Quantitative STEM, Microscopy and Microanalysis, Volume 20, Issue S3, 1 August 201

Advanced Electron Microscopy Techniques and ApplicationsAdvanced Materials Characterization TechniquesElectron and X-Ray Spectroscopy Techniques

Imprinted DOE on varifocal membrane lens

Phuong-Ha Cu-Nguyen、Adrian Grewe、Stefan Sinzinger 等 5 位作者2014-08-01OpenAlex

We present a highly compact, fully integrated tunable lens for confocal hyperspectral imaging with imprinted diffractive structures on a polydimethylsiloxane (PDMS) membrane. The PDMS membrane was patterned by replication technique with a diffractive optical element (DOE) on quartz glass as master mold. The smallest f…

Optical Coatings and GratingsPhotonic and Optical DevicesElectrowetting and Microfluidic Technologies

Fiber metamaterials for terahertz applications

Alessandro Tuniz、Alexander Argyros、Simon Fleming 等 4 位作者2014-08-01OpenAlex

We present recent progress in fiber-based metamaterials. We have drawn fibers containing either sub-wavelength magnetic resonators or wire media, operating up to mid-infrared frequencies. This has led to the first fiber-based metamaterial hyperlenses capable of imaging and focusing well below the diffraction limit ove…

Metamaterials and Metasurfaces ApplicationsTerahertz technology and applicationsMillimeter-Wave Propagation and Modeling

Standardized UXO Technology Demonstration Site, Scoring Record No. 943

Scott Hill、Leonard Lombardo、Jr Fling 等 4 位作者2014-08-01OpenAlex

Abstract : This scoring record documents the efforts of the Environmental Security Technology Certification Program to detect and discriminate inert unexploded ordnance (UXO) utilizing the APG Standardized UXO Technology Demonstration Site calibration lanes and open field sites. This Scoring Record was coordinated by…

Engineering and Material Science Research