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Evidence for a Thickness-Dependent Crossover from Charge- to Strain-Mediated Magnetoelectric Coupling in La0.7Sr0.3MnO3 / PbZr0.2Ti0.8O3 Thin Film Oxide Heterostructures

Steven R. Spurgeon、Jennifer D. Sloppy、Christopher Winkler 等 20 位作者2013-08-01Microscopy and Microanalysis

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Magnetic and transport properties of perovskites and related materialsMultiferroics and related materialsAdvanced Condensed Matter Physics

Theoretical 3D Imaging with He+ Ions

L. A. Giannuzzi2013-08-01Microscopy and Microanalysis

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Electron and X-Ray Spectroscopy TechniquesIon-surface interactions and analysisAdvanced Materials Characterization Techniques

Oxidation of Pseudo-Single Domain Fe3O4 Particles and Associated Magnetic Response Examined by Environmental TEM and Off-Axis Electron Holography

Trevor P. Almeida、Adrian R. Muxworthy、W. Williams 等 4 位作者2013-08-01Microscopy and Microanalysis

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Microstructure and Mechanical Properties of SteelsElectron and X-Ray Spectroscopy TechniquesAdvanced Materials Characterization Techniques

Measurement strategies for Quantification of Carbon in Steel using EPMA

P. Pinard、Anke Aretz、J. Börder 等 5 位作者2013-08-01Microscopy and Microanalysis

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

X-ray Spectroscopy and Fluorescence AnalysisNuclear Physics and ApplicationsElectron and X-Ray Spectroscopy Techniques

Three-Dimensional Reconstruction of Whole Synapses by STEM Tomography

AGMR Sousa、J. Zhang、X. Chen 等 6 位作者2013-08-01Microscopy and Microanalysis

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Advanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesAdvanced Materials Characterization Techniques

Low voltage STEM observation in the latest FE-SEM

Naoya Sakamoto、Shoji Takeuchi、Kazumi Koyama 等 5 位作者2013-08-01Microscopy and Microanalysis

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Advanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesAdvanced Materials Characterization Techniques

Check and Specification of the Performance of EDS Systems Attached to the SEM by Means of a New Test Material EDS-TM002 and an Updated Evaluation Software Package EDS Spectrometer Test - Version 3.4

Vasile‐Dan Hodoroaba、M. Procop、V. Rackwitz2013-08-01Microscopy and Microanalysis

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Advancements in Photolithography TechniquesElectron and X-Ray Spectroscopy TechniquesAdvanced Materials Characterization Techniques

Collagen Ultrastructure and Skin Mechanics in DDR1 KO Mice

David A. Yeung、S. Chen、Jeffrey R. Tonniges 等 7 位作者2013-08-01Microscopy and Microanalysis

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Cellular Mechanics and Interactions3D Printing in Biomedical ResearchCollagen: Extraction and Characterization

Low kV Imaging using Charge Balancing

K. Png2013-08-01Microscopy and Microanalysis

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Advanced Electron Microscopy Techniques and ApplicationsElectron and X-Ray Spectroscopy TechniquesIntegrated Circuits and Semiconductor Failure Analysis

In-Situ Environmental Atom Probe Tomography for Studying Gas-Solid Reactions In Extreme Environments: Instrumentation and Results

Santoshrupa Dumpala、Scott Broderick、Paul A.J. Bagot 等 4 位作者2013-08-01Microscopy and Microanalysis

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

Hydrogen embrittlement and corrosion behaviors in metalsIon-surface interactions and analysisAdvanced Materials Characterization Techniques

Characterization of AlGaN-based GRINSCH Using TEM and Electron Holography

Allison Boley、Hao Sun、Martha R. McCartney 等 5 位作者2013-08-01Microscopy and Microanalysis

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.

GaN-based semiconductor devices and materialsElectron and X-Ray Spectroscopy TechniquesAdvanced Materials Characterization Techniques